The only route to economic viability is absolutely massive beam parallelism inside the tool. But at that scale, there's serious questions about accuracy/reliability. Just one out of hundreds of thousands (or millions) of beams fails for a microsecond and the chip is ruined. This is a problem that is effectively sidestepped for traditional litho -- the masks themselves are created by (slow) e-beam, but mask inspection tools ensure that the masks are perfect before they are actually used to process product wafers.