> The process was repeated five times, resulting in a little over 10^7 program/erase cycles applied to the device. As can be clearly seen in Figure 4d, there is no degradation of the ∆IS-D window throughout these tests, meaning that the endurance is at least 10^7.
https://onlinelibrary.wiley.com/doi/epdf/10.1002/aelm.202101...