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I can't find the references right now, but I recall reading that longevity of microcontrollers and similar could also be somewhat accurately modeled by the Arrhenius equation[1], meaning a 10C increase in operating temperature would result in roughly half the expected lifetime.

[1]: https://en.wikipedia.org/wiki/Arrhenius_equation

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I believe you might be thinking of Black's equation? [1]. It's one equation which attempts to model the failure rate due to electron migration. It isn't a physical model but it seems to, with the right constants, fit reasonably well. The 10C=>halving life time is going to depend on the constants though.

[1] https://en.wikipedia.org/wiki/Black's_equation

Ah, must be. Though it wasn't mentioned by name in the source[1] I found earlier the equation seems to match. Instead they attribute it to Arrhenius, but I guess Black's equation is a special case.

[1]: https://www.ti.com/lit/an/snva509a/snva509a.pdf

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