I'd like to see more research into electrical self-testing.

For example, wire bonds on an IC can be tested by injecting 100 GHz+ signals through the bond and looking at reflections.

Every IC could be designed to do that on every pin (IO and power), which would test everything external to the IC, and some internal IC components like pin drive MOSFETs.

The resulting data can be checked for similarity to 'master' data of known-good units, or even simulations.

This could happen once in the factory, or even potentially on every power up when the device is in the field.