In addition to SEUs (single event upsets) which are bit flips, there are also the following Single Event Effects (See) that are destructive:

- Single Event Burnout, SEB

- Single Event Gate Rupture, SEGR

- Single Event Latch-up, SEL these can be recoverable

In addition there are also Total Ionizing Dose (TID) Effects https://radhome.gsfc.nasa.gov/radhome/tid.htm